Improved Independent Failure Unit Model for ElectromigrationChinese Full Text
Li Zhihong; Gu Ye; Wu Guoying and Wang Yangyuan(Institute of Microelectronics, Peking University,Beijing 100871)
Abstract: Abstract Independent Failure Unit Model（IFU） currently used to predict Electromigration failure is inadequate.According to physical mechanism and some necessary assumptions,the model has been modified. The triple points instead of grains are considered as the Independent Failure Units, and it’s no longer assumed that t50 of each IFU is independent on the size of grain. Our simulation results, the relations of lifetime with both linewidth and grain size, are more consistent with the experimental ... More
- Series：
(I) Electronic Technology ＆ Information Science
- Subject：
Wireless Electronics
- Classification Code：
TN470.597
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